Actually
there not much we can do for looking at the Am button as a sample. What the source
filter is designed for is using the Am buttons as a source where we need to get
rid of the Np interferences and how to optimize that.
What
thickness¡¯s were you using? Try this filter on an Am source and a mid to low Z target
sample with and without the filter.
An 1800sec scan was made using a single Am button, pointed directly at the
Si-PIN detector
Next the filter stack (Al-Ti-CU) was placed between the source and the Si-PIN.
This test was ran until the 59.5 peaks matched (1500s), as this is the area of
interest.
There was dramatic effect on the Np- X-Rays.
Fault- did pick up Cu XRF from filter. Next time will reverse the order of the
sheets in the stack, keeping copper more towards the source.