Here's a better demonstration test.
An 1800sec scan was made using a single Am button, pointed directly at the Si-PIN detector
Next the filter stack (Al-Ti-CU) was placed between the source and the Si-PIN. This test was ran until the 59.5 peaks matched (1500s), as this is the area of interest.
There was dramatic effect on the Np- X-Rays.
Fault- did pick up Cu XRF from filter. Next time will reverse the order of the sheets in the stack, keeping copper more towards the source.
Geo
