On Mon, Aug 26, 2019 at 12:38 PM guy232 <gry.russel@...> wrote:
Apologies for the delay in updating, was a bit under the weather.
Months ago I initially used a 5x mag lens to investigate the solder joints in the PS areas. Didn't see any issues.
Last week when I got back to working on this, I remembered I had a cheap $20 usb microscope laying around.
Discovered very tiny cracks on all 3 pads on both Q946 and Q947. C907 had crack on the component side of the board (the bottom was not cracked) hosted pics of cracks:
IPA scrubbed, dried, applied some amtech flux and reflowed the joints.
Also swapped out C956, I was using the original mallory cap due to ordering the incorrect cap the first time. Used a new Nichicon UHW 330uF 50V that I had on hand. I seen that C956 is listed as +10-100% and believe this is a workable low impedance choice. If not, i'd appreciate any insight on the matter.
Powered up, the shrinking H and V issue and extreme intensity change fail states no longer occurs. The only fault that I notice is that the traces just barely pulse brightness (as if you were just barely turning the intensity knob by 1-2 degrees back and forth) after 3-5min, they remains steady for until powered down.
Going to microscope a bit more and use a long wooden dowel to gently tap around while the unit is running as David Hess mentioned on my project thread on eevblog.
P.S.: Just adding a link to the project thread on eevblog in case it helps anyone in the future etc.