I think the markers are the more important features when using this mode.
Would it then be possible to add some additional measurement functions such as harmonic levels relative to carrier and also 2nd & 3rd order IMD.
Ideally with the option to specify an off-set to the level of the two test signal carrier levels, to compensate for any notch filters that may be used ahead of the analyser to prevent overload during such tests.
The ability to see small concurrent slices of narrow frequency bands, makes it possible to use small bandwidths in each slice, which is not possible with the wide sweep that would normally be required to encompass all of the carriers and their complex harmonics and IMD components.
IP2 & IP3 could then be calculated and read directly.
Regards,
Martin
