Good day,
When I began this process of working with the NanoVNA, I was not certain how the cal standards were being treated. Since the completed cal showed a perfect open, short and termination, I was pretty certain they were NOT defined as REAL SMA connector devices! The SMA connectors are NOT that perfect!
At the time looking through the code, the best I could determine was they were treated as ideal. The 50 fF C for the open was a new input.
In any case, what I find for RLC measurements is that the actual TEST set is a more significant problem than the calibration pieces. The stray L or C of leads to the DUT must be de-embedded. We could dedicate an entire thread on that alone. However, basically you must take into account the strays of the test set. Long leads and stray C make it more involved. But it is tempting to use that method because it is convenient. Just be prepared to adjust your readings. Again, a measurement of a known component is useful. A so called gold standard that is NOT part of the cal sequence is great for a sanity check.
Alan
