Zack W9SZ wrote:
I thought I'd send this e-mail as a curiosity of something I discovered. If
you're trying to measure something with the NanoVNA and there is a strong
transmitted signal source nearby close to the frequency you're trying to
measure at, it could affect your readings
Here's a way to avoid the problem at least sometimes.
I've had something similar happen and since I was measuring the properties of small parts, I used a biscuit tin as a noise chamber. I drilled a hole in the lid to fit an SMA connector and attached my fixture to the inside of the lid. I sanded the lid and tin edge to improve connectivity. With the part to be measured attached to the fixture I closed the tin and made the measurements. It worked quite well. Extending the frequency range where measurements were possible.
