A notification was sent to the group that the file "Crystal measurements with the nanoVNA.pdf" was uploaded to the Files area of the
[email protected] group by EB4APL.
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Coincidentally, Battosai42 has an open-source project for automated measurement of crystal parameters using either a miniVNA or nanoVNA. The measurement method requires a passive test-fixture according to IEC-444 which is a double-pi network terminating the crystal at 12.5Ohm. The IEC-444 fixture appears to be the same one described in the pdf document uploaded by EB4APL.
A beta distribution of the application is located at . I don't have the IEC-444 fixture, but I have run the beta application and verified that it talks to the NanoVNA. A screen-shot of the application is attached.
Keep in mind this is an open-source program that is still under development and, therefore; you should not expect any support - although providing the author with encouraging feedback would surely be appreciated.
- Herb