I facing with corrupted calibration content of EEPROM for channels B and R. The issue appeared after I unsoldered the 2816 EEPROMs in order to make a backup by TL866...
I suspect U26 content, probably checksum test fail for sections B & R. PCB already checked, all EEPROM lines found in good condition.
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I would be grateful if someone could help me with a copy of the U4 & U26 EEPROM - HP8757C, in order to eliminate/understand the malfunction.
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Robert
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YO4HFU