That¡¯s disappointing. There is another layer of the onion yet to peel, apparently.
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The better data sheets show you the test circuit, while others just give you the test currents and leave the rest to your imagination. The idea is this: 1) Forward bias the diode at some current I1 (say, by hooking it up as a half-wave rectifier, driving it with some voltage, and loading with some resistor). Leave it on long enough to reach steady state. The value of I1 should be specified by the manufacturer. 2) Flip the polarity of the drive. The diode current will decay in some fashion. Measure the time taken to drop to whatever the datasheet criteria for ¡°recovered¡± happen to be (10% of the initial value is a common cutoff value). That time is the reverse recovery time. Your circuit will operate the diode under different conditions. You can scale the results of the datasheet experiment to your conditions. The answer is only logarithmically sensitive to current, though, so it¡¯s not necessary in most cases. You usually just want to know if your diode is fast enough. And that only requires knowing that recovery occurs in a small fraction of the time the diode is supposed to be off. Sent from my iThing, so please forgive typos and brevity. On Mar 9, 2021, at 5:50 PM, jrseattle <jdr@...> wrote: |